Authors: |
Xiong Xiao, Nanyang Technological University, Singapore; Shinji Watanabe, Mitsubishi Electric Research Laboratories, United States; Hakan Erdogan, Sabanci University, Turkey; Liang Lu, University of Edinburgh, United Kingdom; John R. Hershey, Mitsubishi Electric Research Laboratories, United States; Michael L. Seltzer, Microsoft Corporation, United States; Guoguo Chen, Johns Hopkins University, United States; Yu Zhang, Massachusetts Institute of Technology, United States; Michael Mandel, City University of New York, United States; Dong Yu, Microsoft Corporation, United States |